Abstract
This paper describes comparison between atomic force microscope (AFM) measurements with a Si tip and a 200-nm-diameter Ni nanowire tip. A produced nanowire AFM probe successfully produced topographic images showing profiles convoluted with a tip radius of 100-200 nm. Bending stiffness of metal nanowires realizes a smaller lateral spring constant than Si and Si3N4 tips. Inelastic deformations of nanowires occurred under excessive loads. The maximum end deflections for nanowires to break the elasticity, which beam mechanics indicates, were applicable to our observed results.
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