Nanoscale Mapping of Semi‐Crystalline Polypropylene

Abstract

We reveal nanoscale information of semi‐crystalline polypropylene with the use of a new secondary electron hyperspectral imaging technique. The innovative combination of cryo‐SEM and low voltage allows for the optimized imaging of these beam‐sensitive materials. Through the collection of secondary electron hyperspectral imaging data, mapping of molecular order on the nano‐scale in the scanning electron microscope (SEM) can be achieved.