Nanoscale Electronic Inhomogeneity in In2Se3 Nanoribbons Revealed by Microwave Impedance Microscopy

Abstract

Driven by interactions due to the charge, spin, orbital, and lattice degrees of freedom, nanoscale inhomogeneity has emerged as a new theme for materials with novel properties near multiphase boundaries. As vividly demonstrated in complex metal oxides (see refs 1-5) and chalcogenides (see refs 6 and 7), these microscopic phases are of great scientific and technological importance for research in high-temperature superconductors (see refs 1 and 2), colossal magnetoresistance effect (see ref 4), phase-change memories (see refs 5 and 6), and domain switching operations (see refs 7-9). Direct imaging on dielectric properties of these local phases, however, presents a big challenge for existing scanning probe techniques. Here, we report the observation of electronic inhomogeneity in indium selenide (In(2)Se(3)) nanoribbons (see ref 10) by near-field scanning microwave impedance microscopy (see refs 11-13). Multiple phases with local resistivity spanning 6 orders of magnitude are identified as the coexistence of superlattice, simple hexagonal lattice and amorphous structures with approximately 100 nm inhomogeneous length scale, consistent with high-resolution transmission electron microscope studies. The atomic-force-microscope-compatible microwave probe is able to perform a quantitative subsurface electrical study in a noninvasive manner. Finally, the phase change memory function in In(2)Se(3) nanoribbon devices can be locally recorded with big signals of opposite signs.