Abstract
To achieve high-quality chemical vapor deposition of monolayer graphene electrodes (CVD-MG), appropriate characterization at each fabrication step is essential. In this article, (1) Raman spectroscopy/microscopy are employed to unravel the contact effect between the CVD-MG and Cu foil in suspended/supported formation. (2) The Surface-Enhanced Raman spectroscopy (SERS) system is described, unveiling the presence of a z-directional radial breathing-like mode (RBLM) around 150 cm−1, which matches the Raman shift of the radial breathing mode (RBM) from single-walled carbon nanotubes (SWCNTs) around 150 cm−1. This result indicates the CVD-MG located between the Au NPs and Au film is not flat but comprises heterogeneous protrusions of some domains along the z-axis. Consequently, the degree of carrier mobility can be influenced, as the protruding domains result in lower carrier mobility due to flexural phonon–electron scattering. A strongly enhanced G-peak domain, ascribed to the presence of scrolled graphene nanoribbons (sGNRs), was observed, and there remains the possibility for the fabrication of sGNRs as sources of open bandgap devices. (3) Electrostatic force microscopy (EFM) is used for the measurement of surface charge distribution of graphene at the nanoscale and is crucial in substantiating the electrical performance of CVD-MG, which was influenced by the surface structure of the Cu foil. The ripple (RP) structures were determined using EFM correlated with Raman spectroscopy, exhibiting a higher tapping amplitude which was observed with structurally stable and hydrophobic RPs with a threading type than surrounding RPs. (4) To reduce the RP density and height, a plausible fabrication could be developed that controls the electrical properties of the CVD-MG by tuning the cooling rate.
Highlights
A strongly enhanced G-peak domain, ascribed to the presence of scrolled graphene nanoribbons, was observed, and there remains the possibility for the fabrication of sGNRs as sources of open bandgap devices
(3) Electrostatic force microscopy (EFM) is used for the measurement of surface charge distribution of graphene at the nanoscale and is crucial in substantiating the electrical performance of chemical vapor deposition of monolayer graphene electrodes (CVD-MG), which was influenced by the surface structure of the Cu foil
The ripple (RP) structures were determined using EFM correlated with Raman spectroscopy, exhibiting a higher tapping amplitude which was observed with structurally stable and hydrophobic RPs with a threading type than surrounding RPs. (4) To reduce the RP density and height, a plausible fabrication could be developed that controls the electrical properties of the chemical vapor deposition (CVD)-MG by tuning the cooling rate
Summary
Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations. Graphene is a two-dimensional hexagonal nanostructure of carbon which exhibits excellent structural and electrical characteristics They are extensively studied for their significantly improved mobility of charge carriers [1]. The precise analysis and optimization of the graphene properties suitable for wafer-scale dimensions are required for the evaluation and development of chemical vapor deposition monolayer graphene (CVD-MG) to further their applications. With this in mind, (1) first, the blue-shift of the in-plane Raman G and 2D peaks of a CVD-MG on a relatively even Cu substrate domain (or nano-valley) with nearly uniform. This article systematically presents various characterization methods capable of detecting obstacles at each step of the fabrication process such that defect-free CVD-MG can be achieved, facilitating the improvement of large, transparent, and flexible electrodes with high electrical quality
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