Abstract
A dielectric-sheathed carbon nanotube probe, resembling a “nanopencil,” has been fabricated by conformal deposition of silicon-oxide on a carbon nanotube and subsequent “sharpening” to expose its tip. The high aspect-ratio nanopencil probe takes advantage of the small nanotube electrode size, while avoiding bending and buckling issues encountered with naked or polymer-coated carbon nanotube probes. Since the effective electrode diameter of the probe would not change even after significant wear, it is capable of long-lasting read/write operations in contact mode with a bit size of several nanometers.
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