Abstract
The carbon nanotube (CNT) probe, where a multi-walled (MW) CNT is attached to a conventional cantilever of an atomic force microscope (AFM), is applied to the simultaneous measurement of topography and contact current flow from/into a sample surface using contact mode AFM. A current of ∼ 2 µA at a sample bias of 1.0 V is measured on a Pt–Pd film using the CNT probe. Compared with a conventional metal-coated probe, the CNT probe achieved higher resolution in both topography and current image. Moreover, the seeming difference in position between topography and current image, which arises from nonidentical acting points on the tip, is minimized due to the small contact area of the CNT.
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