Abstract
The luminescence centers in cadmium sulfide (CdS) nanowires are mapped through cathodoluminescence experiments inside a high resolution transmission electron microscope. This is made possible by positioning an optical fiber within a few micrometers of the area of interest and scanning the focused electron beam while simultaneously collecting the generated photons. The results reveal the distribution of luminescence centers in this material with nanometer-precision. Furthermore, these centers are associated with various intrinsic defects in CdS, which allows mapping these defects even when their concentration is far below the level detectable by other traditional techniques.
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