Abstract
The paper deals with muonic X-ray generation by a two-layer solid hydrogen structure of [Formula: see text]. The target has a high efficiency for analyzing characteristic X-rays in ion implantation. To predict the effect of the presence of protons on X-ray production, we have proposed a new kinetic schema. Muonic object equations have been written to descibe all muonic processes. In the case of a low concentration of argon (Ar) ions (5 ppm) in the sD2 layer a proton concentration of about 20% leads to a significant drop in the X-ray yield. However, in the case of a high Ar concentration (500 ppm) this effect is negligible.
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