Abstract
Herein, multiwavelength Raman spectroscopy studies of graphene samples synthesized directly on SiO2 and Si(100) substrates by microwave plasma‐enhanced chemical vapor deposition (MW PECVD), using five different excitation wavelengths in ultraviolet (UV), visible light, and near‐infrared (NIR) ranges, are presented paying attention to the peculiarities of the spectra. Raman spectra parameters are analyzed to reveal effects of the excitation wavelength. Structural features of graphene directly synthesized on SiO2 and Si(100) are discussed. Analysis of the interdependences of various Raman spectra parameters reveals that the most informative spectra are recorded using 532 nm wavelength excitation. Examination of the full width at half maximum values of G band (FWHM(G)) reveals that the graphene layers synthesized on Si(100) substrate consist of smaller crystallites comparing with SiO2 substrate.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: physica status solidi (RRL) – Rapid Research Letters
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
