Abstract
In this paper we are concerned with the control of temperature and humidity in environmental test chambers for testing electronical devices. These industrial processes are difficult to control for many reasons. They are indeed very coupled processes (temperature and humidity are coupled). They also exhibit non linear characteristics and the control inputs are constrained within 0 and 100%. As well, the process dynamics depend on the set points and on the loads under test. A sophisticated algorithm has been designed that takes into account the above mentioned features. The control algorithm is based on the long range predictive control philosophy, which has been shown to be very efficient in practical situations. In this paper, the algorithm is described with the main ideas. Some experimental results are given concerning two environmental test chambers which are different. For the first one, a three inputs-two outputs piecewise linear model is used for the control. For the second test chamber, a four inputs-two outputs piecewise linear model is used. The experimental results show the efficiency of the proposed control algorithm.
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