Abstract
Electron-impact n-fold (n= 2–5) ionization of Sc+ ions has been studied covering an energy range from threshold to 1000 eV. An electron-ion crossed-beams set-up was employed for the measurement of absolute cross sections as well as for high-resolution energy-scans by which fine details in the energy dependence of the cross section could be uncovered. Contributions of indirect resonant and non-resonant processes to the partial ionization cross sections such as excitation or ionization of an inner shell electron with subsequent autoionization processes have been observed.
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More From: Journal of Physics B: Atomic, Molecular and Optical Physics
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