Abstract
In this article, we propose a novel memristor modelling methodology with multinomial window function obtained by extensive statistical fitting of the measured data of a practical memristor device. Due to such modelling, the desired electrical characteristics that a fabricated memristor device typically exhibits is accurately described. Moreover, the model features the non-linear state transition behaviour. To demonstrate the effectiveness of the proposed modelling methodology, a Verilog-A-based memristor model has been implemented, leading to further development of a memristor-based complementary resistive switch (CRS). We show that the proposed memristor modelling methodology facilitates accurate device-level characteristics and also advances effective circuits and system simulations using memristors.
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