Abstract
Since its accidental discovery in the mid-1950s, porous silicon has attracted great interest due to its wide range of applications. One of them that has been the subject of recent studies is the use of this material as black silicon, in which with the continuous or gradual variation of the refractive index it is possible to significantly reduce the reflectance of silicon surface. In this work, several samples of this material were produced in order to analyze the feasibility of using porous silicon as a radiation absorber in the visible region. The best results obtained were for samples with six layers with refractive index ranging from 1.4 to 2.4, total thickness of 10,800 nm and reflectance of 5%. The influence of porous layer thickness on the reflectance profile was also observed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
