Multi voltage SEM-EDX analysis of metals in historical textiles

Abstract

This paper discusses advantages and limits of previously reported approach of using multi voltage scanning electron microscopy-energy dispersive X-ray spectroscopy (MV SEM-EDX) surface data [1]. Results showed that gilt Au thicknesses can be measured approximately up to 300 nm at 25 kV. The method is particularly useful for determining simple alloys (such as Au and Ag) and compounds (such as Ag2S) with the observation of constant weight ratios for the alloys and compounds (0.15 for Ag2S) in the historical and archaeological textiles. Results showed that beam penetration depth in Ag2S is1800 nm at 25 kV.