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Abstract
A semi-fundamental approach to calibration for multi-element X-ray fluorescence analysis of thin films is described. The curve, calibration line slope vs. atomic number, is calculated using known values for mass absorption coefficients, fluorescent yields and detector efficiency. This curve is then standardised for a particular matrix by determining the slope of at least one matched standard or via a standard addition procedure for one element. The technique is applied to the analysis of industrial waste water.
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