Abstract
We describe a method for microanalysis of oxygen and carbon on the surface of metal samples by the detection of protons from the (t,p) reaction at bombarding energies below 2 MeV. Possible sources of inaccuracies are discussed and an experimental procedure is given for simultaneous analysis of oxygen and carbon surface layers with a sensitivity of 5 × 10 −2 μg/cm 2. The influence of possible contamination by residual vapor pressures during exposure is studied.
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