Abstract

The morphological, structural, and electrical properties of poly(3-methylthiophene) polymer brush films grown on indium tin oxide up to 120 nm thick are reported. Optical spectroscopy experiments indicate that the average orientation of polymer chains is nearly isotropic at thicknesses below 10 nm and above 30 nm, and exhibits mild vertical anisotropy in between. Atomic force microscopy shows that the film surfaces consist of column-shaped domains with an average cross-sectional area (2.3 × 10–3 μm2) and density (200 μm–2) that are independent of film thickness. Analysis of the contact between printed Au electrodes and the polymer brush film shows that a small fraction of the film surface (i.e., the tallest columns) makes contact with the electrodes. The measured bulk resistivity along the columns is 1.4 × 105 Ω·cm, 2 orders of magnitude lower than typical values for spuncast poly(3-alkylthiophene) films, while the resistance along individual polymer chains in the columns is estimated to be 360 GΩ/nm per ...

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call