Morphology of Copper Oxide Nano-Layer Prepared Via Thermal Evaporation Technique

Abstract

The copper oxide (CuO) nanofilms which were prepared by thermal evaporation technique was annealed at (200)℃ for one and two hours at thickness (75) nm. The effect of annealing temperature on the structure was evaluated using a scanning electron microscope (SEM), the particle size ranged from (15.42-35.05) nm. An accurate study for the root mean square and average roughness has been achieved by usage technique of atomic force microscopy (AFM). This paper considered the optical properties of specimens that are obtained through the measuring of absorbance by a UV-visible spectrophotometer. The refractive index showed a decline by increasing the temperature of annealing, while the absorbance was affected positively by the same influencer. The annealing of (200℃) for 2 hours decreased the value of the optical bandgap from 3.3 to 3.05 eV. In obvious, the quantization effect emerging was caused by the acquisition of high values of the energy gap. The absorption and extinction coefficients were directly proportional to the annealing temperature.