Morphology and optical properties of Cu2O-Doped CuO nano films prepared via thermal evaporation technique

Abstract

The films we are characterized morphologically by atomic force microscopy and optical properties are examined also by UV-Visible spectrometer, cupreous oxide (Cu2O) nanofilms which synthesized by thermal evaporation technique with pressure up to (1 X 10−7mbar), with thickness (75) nm. The surface morphological properties of Cu2O films were examined via an atomic force microscope (AFM). The root mean square, average roughness, number of grains on the surface, and average diameter are studied from atomic force microscopy. The optical properties were studied from absorption spectra (by a computer program to calculate the optical parameters) via (UV-Visible) spectrophotometer in the wavelength range of (190-1100) nm. The absorption coefficients determined the type of transition and the absorbance is increased as well as the thickness, while the transmittance decreased. The optical energy gap decreased from (3. 75) eV for the CuO film to (3. 50) eV for the Cu2O-doped CuO film.