Abstract
The high resolution electron microscopy was used to investigate the microstructure of AlN whiskers. The growth mechanisms of AlN whiskers were VLS and VS mechanism. The phenomenon of stacking fault was analyzed. Moreover, the growth mechanism of dendritic crystal was proposed.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
