Abstract
In this paper, we investigate the growth dynamics and the scaling law of growth interfaces in where the interlayer transport is characterized by surface diffusion process similar to the Ehrlich-Schwoebel effect. The mound morphological properties of obtained interfaces depends strongly to the competition between deposition process and diffusion one. The results show that the growth and roughness exponents are not depending to the ratio of the constant diffusion and the deposition flux D/F. However, the width interface decreases exponentially with the ratio D/F and the obtained interfaces reduce their roughness morphology i.e. become smoother at high values of the D/F ratio. Finally, the investigated interfaces exhibits a Familly-Vicsek law with universal exponents.
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