Morphological and Structural Studies of ZnO Nanotube Films Using Thermal Evaporation Technique

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Simple thermal evaporation technique has been used to prepare Pb-doped ZnO nanotube films on Si (100) substrate. X-ray photoelectron spectroscopy (XPS) and energy-dispersive X-ray spectroscopy (EDX) characterization have been employed to investigate the element’s contents, which indicates the presence of stoichiometry ZnO nanotube film. The XRD pattern has shown the wurtzite phase of ZnO and polycrystalline structure. Thickness and morphology of the films were explored from the cross sectional of the films and the surface using scanning electron microscopy (SEM) images. SEM images have confirmed the ZnO nanotubes and modifications of the morphology when adding Pb; the recorded images have proved that the diameter of the nanotubes is about 50 nm. However, AFM and SEM images have shown dense structure (without nanotubes) for non-doped ZnO film (Pb = 0 wt.%).