MORPHOLOGICAL AND OPTICAL STUDIES OF PZN-4.5PT NANOPARTICLES THIN FILMS ON NANOSTRUCTURED SILICON SUBSTRATE

Abstract

The development of renewable energies is today essential to be able to respond in a sustainably way to the growing energy needs on a global scale, as well as to reduce the greenhouse gas emissions responsible for global warming. Among these energies, photovoltaic technology, which converts light power of the sun (renewable source) into electric power, is a major player in the energy transition. However, there is now a need to develop efficient, competitive and less polluting photovoltaic technologies, allowing more energy to be produced at a lower cost. The Pb (Zn<sub>1/3</sub> Nb<sub>2/3</sub>) O<sub>3</sub> (PZN) relaxor and its solid solutions with ferroelectric PbTiO<sub>3</sub> (PT) are of considerable interest both from the applications point of view and from the scientific point of view. In the past, numerous attempts have been made to prepare and study the properties of these materials in the form of thin layers for photovoltaic applications. However, due to the difficulties in preparing pure phase films with a high PZN content, there is very little knowledge of the properties of these materials. The objective of this work is to prepare PZN-4.5PT nanoparticle thin films, to study in detail their morphological and optical properties. The studies were carried out in three main directions: preparation of thin layers (PZN-PT) by deposit of spin coating, and characterize for optical and morphological properties (SEM). UV-visible measurements allowed us to have reflectance of less than 30% after deposit a thin layer PZN-4.5PT doped 1% Mn and undoped for a 70 at 80% absorption in UV-Visible-NIR.