Abstract

This article reviews the development of lithography technology and photoresists as well as their molecular structure for 193 nm and extreme ultravioletlithography(EUVL,the next generation lithography).Especially,we describe the recent research and development of EUV photoresists in detail for the purpose of being conducive to the domestic research on advanced photoresists.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.