Abstract
Using a newly developed edge-support heat treatment method of polyimide, self-standing graphite thin films (GTFs) with a frame were prepared. The graphite basal plane in the GTF was oriented in the direction of the film surface, resulting in GTFs with high quality, large area, and a uniform thickness of 50–120 nm. The thickness distribution (3σ) with an area of 25 mm × 25 mm and a thickness of 54 nm sample was 5.17 nm (measurement area 7.8 mm × 10.4 mm). The electric conductivity of a similarly prepared sample was 1.81 × 104 S/cm. The Young's modulus and ultimate tensile strength of a 60-nm-thick GTF were 1.02 × 102 and 5.34 GPa, respectively. Approximately 50 nm thick GTF samples were thinned by reactive ion etching using oxygen to fabricate a thickness between 10 and 20 nm. A film with an area of 10 mm × 10 mm and thickness of 16.7 nm exhibited a 3σ value of 1.80 nm which means that the thickness difference corresponds to 5 layers of graphite. The conductivity of a 16.2-nm-thick GTF was 1.79 × 104 S/cm. These results indicate that the etching proceeded uniformly. The proposed top-down method is an industrially superior method that overcomes the drawbacks of conventional bottom-up methods.
Published Version
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