Abstract
The implantation-synthesized Cu nanoparticles (NPs) in silica were irradiated with 500keV Xe and Ar ions, respectively. After Xe ion irradiation at a fluence of 2×1016/cm2, the average diameter of Cu NPs was increased from 7.3 to 8.5nm, and especially, Cu NPs with a diameter of 11–14nm were formed beyond the projected range of Cu ions and nearly aligned at the same depth, which presented a higher volume fraction. As a result, the Cu surface plasmon resonance (SPR) absorption peak was enhanced. However, if Xe ion fluence was less than 1×1016/cm2, no clear variation of the Cu SPR absorption peak could be found. Further, it was also revealed that Xe ion irradiation caused the Cu SPR absorption peak to more drastically change than Ar ion irradiation at the same ion fluence. The underlying processes for the above findings were discussed and tentatively proposed.
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