Abstract

Yttrium iron garnet (YIG) thin films were grown on (0001) sapphire substrates using pulsed laser deposition (PLD) technique with a XeCl excimer laser. The as-deposited films were amorphous and diamagnetic. Two kind of annealing procedures were carried out to modify the properties of garnet films. The structural, morphological, and magnetic behavior of YIG films treated by laser-magnetic field or annealed at temperature close to the melting point for 24 h were studied and compared. Polycrystalline films with flat surface, small grain size, and low droplet contamination were produced. The films exhibit soft magnetic properties, where easy axis of magnetization lies in the film plane. The high values of perpendicular magnetic anisotropy were registered.

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