Abstract
This paper presents a modification of a test bench which has been built for device characteristation. The test bench is able to measure the static losses (blocking and forward conduction) and the dynamic losses (turn on and turn off). To have a comparison of devices designed for soft-switching applications and devices for converters in hard-switching applications the existing test bench is modified to allow measurements for devices in soft-switching conditions. The existing test bench is prepared for testing IGBTs, IGCTs, IETOs and other similar devices.
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