Modeling thermal transient process in HTS microstrip line with non-homogeneous current density distribution

Abstract

Thermal destruction of superconducting state in microwave high- T c superconducting (HTS) devices considered as a thermal transient process caused by Joule heating of HTS films has been investigated. A new approach to modeling time dependent temperature distribution has been suggested and realized in a microstrip HTS resonator taking into account non-homogeneous current distribution along the resonator. The results have been discussed. Thermal destruction of superconducting state in microstrip HTS line at microwaves has been investigated. Time dependent temperature distribution has been modeled in the line using the non-linear model of the surface resistance dependent on current density. Modeling has been done for HTS films of various quality taking into account non-homogeneous current density distribution in the line cross-section. The results have been compared and discussed.