Abstract
This paper presents a sub-circuit model for partially depleted SOI drain extended MOSFETs (DEMOS) based on the HiSIM-HV model suitable for circuit simulator implementation. Our model accounts both for the high voltage and the floating body effects such as the quasi saturation effect, the impact ionization in the drift region and the famous kink effect. The model is validated for a set of channel and drift lengths to demonstrate the scalability of the model. The accuracy of the proposed sub-circuit model is verified using 2-D numerical simulations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.