Modeling of non-contact atomic force microscope with two-term excitations

Abstract

The goal of this article is to study the dynamical behavior of atomic force microscope cantilever in its non-contact mode of operation. The lumped parameter model is used to construct the mathematical model of the cantilever. The tip of the cantilever is excited by two harmonic terms and is in interaction with the sample surface. The Van der Waals force, tip-sample interaction force, makes the system nonlinear. Using multiple scales method, the frequency response equation is found. The effects on the amplitude of excitations, the damping coefficient, and initial sample – tip distance is studied and presented as the results.