Abstract

AbstractTo accurately simulate the electrical characteristics of high‐power insulated gate bipolar transistor (IGBT) applied under transient overload extreme conditions, this article presents an electrothermal modeling method based on PSpice and Simulink. In this method, the structural parameters of the IGBT module are accurately extracted through a scanning electron microscope, and the corresponding seven‐layer RC thermal network model is established in Simulink. Besides, a new lumped‐charge physical model is constructed in PSpice, which can accurately describe the electrical behaviors of IGBT at different temperatures by circuit simulation. Then, cosimulation under a multirate simulation strategy is realized through a Matlab script file, which controls both the PSpice circuit simulation and the Simulink thermal simulation. Finally, the method is verified through a short‐circuit experiment on an ABB 3.3 kV/1500 A high‐power IGBT module. © 2019 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.