Abstract
Thermal crosstalk in a high density resistive random access memory (RRAM) array due to the self-heating effect is one of the most critical issues affecting device reliability. In this paper, an improved cross-point array is proposed to optimize the thermal management of the RRAM array. An in-house simulator is employed to study the performance of the improved RRAM array. Simulation results reveal that the improved RRAM array can help to reduce thermal crosstalk in highly integrated RRAM arrays.
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