Abstract
Voltage-controlled oscillators (VCOs) have been shown to dominate the single-event transient (SET) response of mixed-signal circuits such as the phase-locked loop (PLL). An analytical model is presented to determine the VCO design parameters and the associated SET vulnerability. Additionally, radiation-hardened-by-design (RHBD) techniques to mitigate SETs in current-starved VCOs are presented. The proposed mitigation techniques reduce the phase displacement in the output of the VCO following a single-event (SE) by approximately 66%. The availability of the analytical model and RHBD techniques will improve the SE performance of VCO and PLL designs to ensure a specified tolerance to SEs.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
