Abstract
The paper presents a results of the development of metal clad waveguide (MCWG) sensors on thin-film structures Al/Nb 2 O 5 and a sensor unit of angular type “Plasmontest” which is intended to create, process, and study optical signal reflected from the interface of the medium and thin-film sensor substrate. The device can be used as surface plasmon resonance (SPR) and MCWG sensors. The data processing includes noise suppression, interpolation of data, calculation of the points of minimum on reflectivity curves and generation of their angular position from time (sensorogramm). Thin-film technology of MCWG Al/Nb 2 O 5 developed by us is presented too. As a demonstration of the capabilities of “Plasmontest” and MCWG Al/Nb 2 O 5 sensors the experimental date of refractometric measuring are presented.
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