Model and analysis of single event transient sensitivity based on uncertainty quantification

Abstract

Since there are many uncertain factors in the generation and propagation of single event transient (SET), it is a very important issue that how to quantify the impact of these uncertain factors on SET. Based on equivalent circuit and generalized polynomial chaos (gPC), an uncertainty quantification (UQ) model for SET generation is proposed. The impact of the uncertainty of accumulated charge on SET is effectively quantified by the proposed UQ model. The results show that the UQ model matches the exact numerical solution very well, with the maximum error of 2.07% and the average error of 0.14%, respectively. Based on unascertained theories, a probability model for the electrical masking effect is presented to evaluate the pulse width and probability of SET after a transient pulse propagating through a logic gate. The simulation results show that the probability model is in good agreement with SPICE, with the average error of 4.27% in pulse width and 7.93% in the responding probability, respectively.