Abstract

The results of studies of MOCVD growth regularities of GaAs/AlGaAs superlattices with narrow forbidden minibands are presented. The spectra of photoluminescence and X-ray diffraction are measured, the concentration distribution profiles of components are determined by secondary-ion mass spectrometry, and the concentration distribution of charge carriers are determined by the method of capacitance profiling. The relation of the growth modes of heterostructures to their crystalline characteristics and luminescent and electrical properties are studied. The photoluminescence measurements indicate the high quality of the superlattices. X-ray diffraction and the data on secondary ions confirm the high periodicity of the superlattices grown in the optimized modes. The nonlinear current-voltage characteristics with a region of negative differential conductivity at moderate voltages and subsequent current increase at higher voltages because of tunneling between the minibands is found for the superlattices grown in the optimal growth modes. Current oscillations at frequencies of ∼60 MHz were observed in the region of negative differential conductivity. The negative differential conductivity and oscillations confirm the presence of the electron localization effect in moderate electric fields in the first conductivity miniband, which emerges due to the Bragg reflection of carriers in the superlattice.

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