Abstract

Thin-film lithium niobate is an attractive integrated photonics platform due to its low optical loss and favorable optical nonlinear and electro-optic properties. However, in applications such as second harmonic generation, frequency comb generation, and microwave-to-optics conversion, the device performance is strongly impeded by the photorefractive effect inherent in thin-film lithium niobate. In this paper, we show that the dielectric cladding on a lithium niobate microring resonator has a significant influence on the photorefractive effect. By removing the dielectric cladding layer, the photorefractive effect in lithium niobate ring resonators can be effectively mitigated. Our work presents a reliable approach to control the photorefractive effect on thin-film lithium niobate and will further advance the performance of integrated classical and quantum photonic devices based on thin-film lithium niobate.

Highlights

  • As one of the most widely used synthetic crystals, lithium niobate (LN) has played a critical role in modern telecommunication due to its favorable electro-optic and optical (2) nonlinearity as well as broad optical transparency window [1,2,3,4]

  • With recent development on nanofabrication technique, low-loss waveguides and high-quality microresonator have been demonstrated on monolithic thin-film lithium niobate on insulator (LNOI) material system [7], providing a promising on-chip platform for second harmonic generation (SHG) [8, 9], frequency comb generation [10,11,12], and electro-optic modulation [13]

  • We study the impact of dielectric cladding and the following heat treatment on the PR effect of thin-film LNOI microring resonators

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Summary

Introduction

As one of the most widely used synthetic crystals, lithium niobate (LN) has played a critical role in modern telecommunication due to its favorable electro-optic and optical (2) nonlinearity as well as broad optical transparency window [1,2,3,4]. With recent development on nanofabrication technique, low-loss waveguides and high-quality microresonator have been demonstrated on monolithic thin-film lithium niobate on insulator (LNOI) material system [7], providing a promising on-chip platform for second harmonic generation (SHG) [8, 9], frequency comb generation [10,11,12], and electro-optic modulation [13] In many of these applications, the performance and power handling of devices fabricated on the LN platform have been strongly limited by photorefractive (PR) effect [8, 14].

PR effect in the LN microring resonator
Mitigation of the PR effect by removing the cladding layer
Cavity dynamics in the LN ring resonator during the laser scan
Evolution of the PR effect during the fabrication process
Discussion and conclusion
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