Abstract
We demonstrate a millimeter-wave surface imaging technique using a near-field scanning millimeter-wave microscope with a resonant standard waveguide probe. The metallic probe tip in the resonant waveguide was designed to couple energy into and out of the resonant waveguide. By measuring the shift of the resonant frequency and the change of the quality factor in the near-field zone, we obtained millimeter-wave near-field images of YBa2Cu3Oy thin films on MgO substrates with a spatial resolution better than 2 μm.
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