Abstract
We have locally modified a cleaved surface of single crystalline Bi2Sr2CaCu2O8+δ by local anodic oxidation using scanning tunneling microscope-assisted near-field scanning microwave microscope (STM-assisted NSMM). After the modification, we have measured the resonant frequency and the quality factor of the microwave responses near the modified region at 7.31GHz. The resonant frequency and the quality factor increase at the modified region. It has been confirmed that the STM-assisted NSMM enables us both to modify the sample surface and to measure the microwave impedance on the modified region in nanoscale.
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