Microwave probing of relaxation oscillations related to terahertz power detection in superconducting hot electron bolometers

Abstract

Relaxation oscillations related to terahertz (THz) power detection in superconducting niobium nitride hot electron bolometers (HEBs) have been studied using microwaves as a probe. The reflected microwave signal, which is related to the impedance changes of the HEB irradiated by an incident THz signal, can be used to characterize relaxation oscillations. The frequency of relaxation oscillation switching between the superconducting and resistive states increases linearly with incident THz power but nonlinearly with bias voltage or bath temperature. The observed strong periodic pulse trains of relaxation oscillations have a maximum duty cycle of ∼50%. These strong switching pulses indicate that DC Joule heating, THz radiation or thermal energy is absorbed in the bi-stable region of the HEB intermittently. In addition to relaxation oscillations, we also see weaker oscillations when the device is in the resistive state, which we call intrinsic oscillations. These have a constant frequency at the order of 10 kHz which is independent of external stimuli. The weak periodic pulse trains at a constant frequency can be divided into mainly two types—one is the pulse train with a small duty cycle and the other is the quasi-square wave. Measurement of these oscillations in HEBs has some practical applications. Digital THz power measurement with frequencies below and above the gap frequency can be made based on the linearity between relaxation oscillation frequency and incident THz power. The relaxation oscillation frequency can be used to estimate the maximum speed of a THz direct detection system especially for a multi-pixel HEB array. In particular, extra noise induced by relaxation oscillations and intrinsic oscillations can be determined for the HEB operating as a THz direct detector.