Abstract
A novel technique to examine thinned-array reflecting screens by means of a microwave interferometer operating at a 8.8 mm wavelength is suggested. The screen is modeled with a 6×6 Costas array, and the standing wave profiles are analyzed for the near-field region of the screen. The results of the experiment show an increase in the fractal dimension of the screen accompanied by a decrease in field strength near the first antinode and by rearrangement of the standing wave profile.
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