Abstract
Relationship between the crystallization behaviour and microwave dielectric properties of (1-x)MgSiO3-xCaMgSi2O6 glass-ceramics was investigated as a function of the CaMgSi2O6 content. The degree of crystallization of glass-ceramics specimens depended on the CaMgSi2O6 content and was evaluated by X-ray diffraction analysis with a combination of Rietveld and reference intensity ratio methods. The dielectric constant (K) and the quality factor (Qf) of the specimens increased with increasing CaMgSi2O6 content. These results could be attributed to the dependence of K and Qf on the degree of crystallization. Effect of the crystallite size of the specimens on their microwave dielectric properties is also discussed.
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