Abstract
Nanomaterial characterization using microwaves is needed in nanoscale semiconductor devices, microwave imaging, EM shielding, and wireless communication. Many nanomaterials are used as metallic or dielectric layers in these applications. In this paper, we report the characterization of nanomaterials using planar Microwave Slot Resonator (MSR) which was designed and studied using 3D EM simulation tool. The response of MSR is parameterized which offers a platform to calculate relative permittivity (ε r) and conductivity (σ) from measured high frequency response of nanomaterial loaded MSR. With simplified method, this microwave characterization offers accurate and faster results which be used in design, calculation and numerical analysis of nanomaterial based electronic/optoelectronic devices and sensor/shielding applications.
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