Abstract
Abstract Silicon nitride whiskers were prepared by carbothermal reduction and nitridation of diatomaceous earth at temperature of 1350°C under the presence of nitrogen and ammonia. Scanning and transmission electron microscopy (SEM), electron probe micro-analysis (TEM) and X-ray diffraction were used to characterize the microstructure. SEM studies indicated that the whiskers were quite straight and hexagonal in cross-section. The whiskers were found to be highly crystalline, as determined by TEM analysis.
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