Abstract
The phase composition of the reaction zone between Ti matrix and AlN particles was investigated employing electron probe X-ray microanalysis (EPMA) and electron backscatter diffraction techniques (EBSD) in scanning electron microscopy (SEM). The TiN (cubic, NaCl type), Ti 3AlN (cubic, perovskite type) and Ti-rich Ti 3Al (hexagonal, Ni 3Sn type) phases were identified in the reaction zone after anneals at 900, 1000 and 1100°C. The binary nitride TiN and the ternary nitride Ti 3AlN exhibit a complex interpenetrating morphology. A two-phase, Ti 3AlN/Ti 3Al, lamellar region was observed between the Ti 3AlN and Ti 3Al layers after annealing at 1000 and 1100°C.
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