Abstract
Gd/W multilayer films (MLF) have been grown by DC magnetron sputter deposition, and the variation in structure with layer thickness has been determined using high-resolution electron microscopy. The technique has shown some evidence for a thin interfacial region and strong [0002] texture along the film normal for Gd. The cubic GdH 2 is sometimes observed, with (111) planes (equivalent to Gd (0002) in the film plane. The relationship between structure and magnetic anisotropy is briefly discussed.
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