Abstract
The microstructure of Bi 2(Sr,Ca) 3Cu 2O x /Bi 2Sr 2CuO y /Bi 2(Sr,Ca) 3Cu 2O x (2212/2201/2212) trilayer f ilms was studied by cross-sectional high-resolution transmission electron microscopy. The trilayer films were fabricated in situ by ion beam sputtering on polished (001) MgO substrates with a thin 2201 buffer layer. The buffer layers significantly improved the surface flatness of the trilayer films. The trilayer films had an epitaxial relationship and the c-axis preferred orientation normal to the substrate surface. The intermediate 2201 layer had a uniform thickness, and the 2212/2201 interfaces were extremely sharp. The results indicated that the epitaxial 2212/2201/2212 trilayer films were suitable for the fabrication of sandwich-type Josephson junctions.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
