Microstructure evolution of pure tungsten after low-energy and high-fluence He+ implantation assessed by synchrotron grazing incidence X-ray diffraction

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A clear understanding on the H/He plasma implantation behavior in the plasma facing materials is a key issue to manage the implanted H/He in a future nuclear fusion reactor. In this work, the microstructure evolution of pure tungsten after low-energy (100 eV) and high-fluence (1023~1024 /m2) helium ion implantation was investigated by the synchrotron grazing incidence X-ray diffraction (S-GIXRD) and nanoindentation. Benefiting from the depth dependence of S-GIXRD and nanoindentation, it was found that the unimplanted W surface layer was composed of two zones: the compressed zone with a thickness of ~56 ± 2 nm under the top surface, which was introduced by the mechanical polishing, and the unaffected matrix. The helium implanted W surface layer was composed of four zones along the direction from the top surface to deep depth: the compressed zone with a thickness of ~46 ± 10 nm, transition zone with a thickness of ~146 ± 14 nm, expanded zone, and the matrix. The compressed zone becomes thinner after He implantation possibly owing to the formation of He-complexes. The expanded zone resulted from the helium atoms entering into the tungsten lattice, while the transition zone is a result of competition between the expanding and compressing effects.