Abstract
The data on the influence of the microstructure of In2S3 films produced by thermal evaporation upon their optical properties in relation to the film’s thickness are reported. The atomic force spectroscopy data for the layers that are produced in identical technological conditions, but exhibit different spectral positions of the optical absorption edge are presented and discussed. Variations in the optical band gap from 2.0 to 3.6 eV under variations in the thickness of the In2S3 films from 800–450 nm to 50–30 nm are observed. The variations are interpreted as a result of variations in the content of grains, specific in dimensions and microstructure.
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